Перегляд за автором "Poperenko, L.V."

Сортувати за: Порядок: Результатів:

  • Broadband interference filters with suppression of high reflection bands of 4-, 5- and 6-th orders 
    Pervak, V.Yu.; Poperenko, L.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2005)
    The influence of optical constants dispersion on spectral properties of multilayer interference systems, in which spectral characteristics suppression of the adjacent bands of high reflection of 4, 5 and 6-th orders are ...
  • Determination of optical parameters of CdTe films by principal angle ellypsometry 
    Kornienko, K.N.; Odarych, V.A.; Poperenko, L.V.; Vuichik, N.V. (Functional Materials, 2006)
    The principal angle and ellipticity of the light wave reflected from the surface of the single-crystal silicon coated by a CdTe film have been measured in 366-579 nm spectral region. Using a specially developed computer ...
  • Effect of thin contaminating coating on reflectance of metallic mirror placed inside the vacuum chamber of a fusion device 
    Bondarenko, V.N.; Bardamid, A.F.; Konovalov, V.G.; Voitsenya, V.S.; Orlinskij, D.V.; Poperenko, L.V.; Vinnichenko, M.V. (Вопросы атомной науки и техники, 2000)
    The practice of use of diagnostic mirrors inside the fusion devices revealed the appearance of a deposit on the mirror surface. Such deposit is a result of condensation of the erosion materials of those inner components ...
  • Ellipsometric control of stress homogeneity in surface layer of amorphous metal alloy ribbons 
    Poperenko, L.V.; Ozerov, M.V. (Functional Materials, 2005)
    The level of internal strain changes in the subsurface layer of Fe-based (Fe₇₅Ni₄Мо₃Si₂В₁₆ and Fe₈₀В₂₀) amorphous metal alloys has been analyzed. Optical measurements were carried out for as-cast ribbons. . The noncircular ...
  • Ellipsometric study of ion implanted copper surface and its room temperature oxidation 
    Poperenko, L.V.; Lohner, T.; Stashchuk, V.S.; Khanh, N.Q.; Vinnichenko, M.V.; Yurgelevych, I.V.; Essam Ramadan Shaaban; Nosach, D.V. (Functional Materials, 2005)
    The room temperature oxidation of ion-implanted copper surface has been studied ex situ and in situ using ellipsometry. The ellipsometric parameters T and Д were measured at light incidence angle 75° for different wavelength ...
  • Ellipsometry examination of copper alloys with transitive metals 
    Filipov, Y.V.; Staschuk, V.S.; Poperenko, L.V.; Vovchenko, V.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2004)
    Electron structure of copper alloys with 3d transition metals (Fe, Co and Cr) have been studied basing on elliposometrical measurement of D and Y in wide spectral range hn = 1.0–4.95 eV. Spectral dependences of Cu-Cr alloys ...
  • Energy loss researches of diamond microgrinded laser mirrors by Fourier optics methods 
    Staschuk, V.S.; Kononchuk, G.L.; Poperenko, L.V.; Stukalenko, V.V.; Filipov, Y.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2009)
    The diffraction losses of laser mirrors were determined by using specially designed spectrometer of spatial frequencies. Reflection surface (70 mm diameter) was made by diamond microgrinding, but instead of an ideal ...
  • Factor of interfacial potential for the surface plasmon-polariton resonance sensor response 
    Lopatynskyi, A.M.; Lopatynska, O.G.; Poperenko, L.V.; Chegel, V.I.; Guiver, M.D. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2008)
    In this work, we investigate how the application of an external potential difference to the sensitive gold-electrolyte interface influences the optical response of a sensor based on the surface plasmon-polariton resonance ...
  • Ganges in crystal structure of fullerene films at alloying and radiation defect formation 
    Dmytrenko, O.P.; Kulish, N.P.; Prylutskyy, Yu.I.; Grabovskiy, Yu.E.; Pavlenko, E.L.; Poroshin, V.G.; Rodionova, T.V.; Poperenko, L.V.; Stashchuk, V.S.; Shlapatskaya, V.V.; Scharff, P. (Functional Materials, 2006)
    The crystal structure of the C₆₀ fullerene films with their alloying by the oxygen molecules and copper atoms in studied and under the influence of high energy eletron irradiation (Ee = 1.8 MeV) is investigated. It is ...
  • Influence of ion implantation on the near-surface structure of thin Ni and Pd films on lithium niobate and lithium tantalate 
    Lysiuk, V.O.; Staschuk, V.S.; Kluy, M.I.; Vakulenko, O.V.; Poperenko, L.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2007)
    The systems “thin Ni film – lithium niobate” and “thin Pd film – lithium tantalate” are implanted by Ar⁺ ions with an energy of 100 keV and a dose of 10¹⁶ cm⁻². Analyses of the systems by AFM and SEM have shown that the ...
  • Influence of irradiation by a particle beam on optical properties of metal mirrors 
    Poperenko, L.V.; Vinnichenko, M.V.; Kosel, P.B.; Vinnichenko, K.L. (Functional Materials, 2005)
    The surface of copper and stainless steel mirrors near the area destroyed by electron beam has been characterized by means of ellipsometric diagnostics. The treatment did not result in any changes in the surface microrelief, ...
  • Influence of oxide layers on optical properties of copper in a wide spectral range 
    Filipov, Y.V.; Staschuk, V.S.; Poperenko, L.V. (Functional Materials, 2005)
    Optical properties of flawless bulk copper sample has been studied based on spectroel-lipsometry measurements in a wide spectral interval (Av = 0.18 to 4.87 eV) at various angles of light incidence. The main characteristics ...
  • Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique 
    Rozouvan, T.S.; Poperenko, L.V.; Shaykevich, I.A. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2015)
    Si crystal surface after chemical etching was studied using ellipsometry, atomic force microscopy and scanning tunneling microscopy. The ellipsometric parameters as functions of light incidence angles at two light wavelengths ...
  • Investigations of characteristics of metal film based pyroelectric detectors implanted by Ar+ ions 
    Lysyuk, V.O.; Poperenko, L.V.; Staschuk, V.S. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2002)
    Functional parameters and characteristics of pyroelectric detectors based on the system thin metal film - thick pyroelectric substrate are investigated. Such metals as Ni, Mo and Ti were used to increase absorption of such ...
  • Localized surface plasmon resonance in Au nanoprisms on glass substrates 
    Lopatynska, O.G.; Lopatynskyi, A.M.; Borodinova, T.I.; Chegel, V.I.; Poperenko, L.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2015)
    Metal nanocrystals are actual objects for the modern biophysics mainly because of their usage in sensors based on localized surface plasmon resonance (LSPR) and as active substrates for surface-enhanced spectroscopies. ...
  • Optical and magneto-optical properties of thin films for high density information recording 
    Kravets, V.G.; Poperenko, L.V.; Yurgelevich, I.V.; Petford-Long, A.K. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2002)
    It was found that optical and magneto-optical (MO) properties of thin film materials have potential application for blue laser recording. For this purpose, we have used a combination of ellipsometric and polar MO Kerr ...
  • Optical characteristics of Al₂O₃ oxide coatings on copper mirrors made by diamond microgrinding 
    Odarich, V.A.; Poperenko, L.V.; Staschuk, V.S.; Filipov, Y.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2003)
    Ellipsomety examination of dielectric sheetings and measured of reflection spectrum at normal incidence there carried out. A film of Al₂O₃ on a surface of copper mirrors of a diamond microgrinding was deposited. The thickness ...
  • Optical investigation of the electronic structure of alloys Сu-Fе 
    Vovchenko, V.V.; Staschuk, V.S.; Poperenko, L.V.; Lysiuk, V.O. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2007)
    We investigate the optical properties of Cu-Fe alloys in a wide interval of concentrations (7.5–30 at. %) and in a wide spectral interval (0.25–7 µm). An additional absorption associated with interband electron transitions ...
  • Optical parameters of the film naturally formed on the surface of cadmium telluride single crystals 
    Odarych, V.A.; Poperenko, L.V.; Yurgelevych, I.V.; Gnatyuk, V.A.; Toru Aoki (Functional Materials, 2013)
    Ellipsometric study of different surfaces of CdTe single crystals was carried out at a light wavelength of 632.8 nm. CdTe(110) crystals with cleaved surfaces after long time storage under ambient air conditions, Cd- and ...
  • Optical properties of graphene film growing on a thin copper layer 
    Rozouvan, T.S.; Poperenko, L.V.; Kravets, V.G.; Shaykevich, I.A. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2016)
    Optical properties and surface structure of graphene films grown on thin 1-μm copper layer using the chemical vapor deposition method were investigated applying spectroscopic ellipsometry and nanoscopic measurements. ...